ǂan ǂellipsometric study
Nebojša Romčević (Author), Rebeka Rudolf (Author), J. Trajić (Author), M. Romčević (Author), B. Hadžić (Author), Dana Vasiljević-Radović (Author), Ivan Anžel (Author)

Abstract

In this paper the results of optical properties investigations on plastically deformed copper are presented. The optical properties of the plastically deformed copper were studied using spectroscopic ellipsometry in the ultraviolet-visible (UV-VIS) range. Chemically pure copper was deformed by applying the Equal Channel Angular Pressing (ECAP) technique. During the last decade, equal-channel angular pressing procedure was used for the fabrication of ultrafine-grained metals and alloys. The plastic deformation of metallic materials leads to the production of bulk nano-scale structures with ultrafine grains and cross-sections, which remain about equal before and after deformation. The parameters of the sample were calculated using a two-film model together with the Bruggeman effective medium approximation.

Keywords

ellipsometric spectroscopy;atomic force microscopy;copper;amorphisation;

Data

Language: English
Year of publishing:
Typology: 1.01 - Original Scientific Article
Organization: UM FS - Faculty of Mechanical Engineering
Publisher: Inštitut za kovinske materiale in tehnologije Ljubljana
UDC: 669.3:620.17
COBISS: 15446038 Link will open in a new window
ISSN: 1580-2949
Parent publication: Materiali in tehnologije
Views: 1771
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Other data

Secondary language: Slovenian
Secondary title: Optične lastnosti plastično derformiranega bakra
Secondary abstract: V članku so predstavljeni rezultati raziskav optičnih lastnosti plastično deformiranega bakra. Te so bile raziskane s spektralno elipsometrijo v območju vidne UV-svetlobe. Kemijsko čist baker je bil deformiran z uporabo ECAP-metode (enakokotno koničasto stiskanje). V zadnjem času se ECAP-postopek uporablja za izdelavo ultra udrobnjenih kovin in zlitin. Takšna plastična deformacija kovinskih materialov vodi k izdelavi masivnih nanostruktur z ultra drobnimi zrni in prečnim prerezom, kar omogoča približno enakost pred deformacijo in po njej. Parametri preiskanih vzorcev so bili izračunani na osnovi uporabe dvojne plasti - filma skupaj s Bruggemanovo srednjo efektivno aproksimacijo.
Secondary keywords: elipsometrična spektroskopija;atomska mikroskopija;baker;amorfizacija;
URN: URN:NBN:SI
Type (COBISS): Scientific work
Pages: str. 463-465
Volume: ǂLetn. ǂ45
Issue: ǂšt. ǂ5
Chronology: 2011
ID: 1727933