Prototype of integrated circuits testing device

magistrsko delo

Luka Kačič (Author), Iztok Kramberger (Mentor)

Abstract

The field of electronics is constantly evolving, and this master's thesis aims to explore the latest developments and investigate their potential impact on various applications. The research covers topics such as semiconductor devices, integrated circuits, communication systems, and digital signal processing. Based on extensive literature review, theoretical analysis, and experimental investigations, the thesis provides valuable insights into the latest trends in electronics and testing, especially in the automotive industry. The project's focus is on the development of a prototype testing device for integrated circuits in cooperation with company NXP Semiconductors Austria GmbH & Co KG. The device needs to effectively find failures in the investigated integrated circuit's digital section and offer powerful forcing and measuring options to verify the analog parameters. The solution developed includes a configurable Serial Peripheral Interface (SPI) master node communication block and a Graphical User Interface (GUI). Effective communication is essential for any electronic system, and the importance of communication continues to grow with technology advances. I have demonstrated the versatility of LabVIEW as a programming tool for FPGAs and IC testing, providing an effective and user-friendly environment for electronics engineers to develop and test. By enhancing the efficiency and accuracy of IC testing, the work can help manufacturers and engineers accelerate their testing processes, reduce costs, and improve product quality. I have gained a deeper understanding of the challenges involved in electronics testing and the importance of efficient testing processes. The research makes a meaningful contribution to the field of electronics engineering and has the potential to shape the future of electronics testing and improve the reliability and performance of electronic devices.

Keywords

state machine;SPI;FPGA;LabVIEW;

Data

Language:	English
Year of publishing:	2023
Typology:	2.09 - Master's Thesis
Organization:	UM FERI - Faculty of Electrical Engineering and Computer Science
Publisher:	[L. Kačič]
UDC:	621,3.049.77(043.2)
COBISS:	151842051
Views:	169
Downloads:	0
Average score:	0 (0 votes)
Metadata:

Other data

Secondary language:	Slovenian
Secondary title:	Optimizacija RF parametrov na NFC napravi z umetno inteligenco
Secondary abstract:	Področje elektronike se nenehno razvija, magistrsko delo pa si prizadeva raziskati najnovejše tehnologije in preučiti njihov potencialni vpliv na različne aplikacije. Raziskava obsega teme, kot so polprevodniške naprave, integrirana vezja, komunikacijski sistemi in digitalna obdelava signalov. Na podlagi obsežne literature, teoretične analize in eksperimentalnih raziskav magistrsko delo ponuja vpoglede v najnovejše trende v elektroniki in testiranju, še posebej v avtomobilski industriji. Projekt se osredotoča na razvoj prototipa naprave za testiranje integriranih vezji v sodelovanju s podjetjem NXP Semiconductors Austria GmbH & Co KG. Naprava bo učinkovito odkrila napake v digitalnem delu integriranega vezja in ponujala zmogljivost ter merilne možnosti za preverjanje analognih parametrov. Razvita rešitev vključuje nastavljiv blok serijske komunikacije Serial Peripheral Interface (SPI) in grafični uporabniški vmesnik (GUI). Učinkovita komunikacija je bistvenega pomena za vsak elektronski sistem, pomembnost komunikacije pa se s tehnološkim napredkom še naprej povečuje. Predstavil sem vsestranskost programa LabVIEW, kot orodja za programiranje FPGA-jev in testiranje tiskanih vezji, ki omogoča učinkovito in uporabniku prijazno okolje za razvoj in testiranje. Z izboljšanjem učinkovitosti testiranja tiskanih vezji, lahko delo pomaga proizvajalcem in inženirjem pospešiti njihove teste, zmanjšati stroške in izboljšati kakovost izdelkov. Pridobil sem globlje razumevanje, izzivov, ki jih prinaša testiranje elektronike in pomembnosti učinkovitih procesov testiranja. Raziskava prispeva k razvoju področja elektrotehnike in ima potencial, da oblikuje prihodnost testiranja elektronike ter izboljša zanesljivost in zmogljivost elektronskih naprav.
Secondary keywords:	elektronika;serijska komunikacija SPI;tiskana vezja;program LabVIEW;magistrske naloge;
Type (COBISS):	Master's thesis/paper
Embargo end date (OpenAIRE):	2026-03-29
Thesis comment:	Univ. v Mariboru, Fak. za elektrotehniko, računalništvo in informatiko, Elektrotehnika
Pages:	1 spletni vir (1 datoteka PDF (XIV, 75 f.))
ID:	18273109