ToF-SIMS depth profiling of metal, metal oxide, and alloy multilayers in atmospheres of H[sub]2, C[sub]2H[sub]2, CO, and O[sub]2
Povzetek
Ni podatka o povzetku
Ključne besede
Ions;Layers;Mass spectrometry;Metals;Oxides;SIMS depth profiling H2 C2H2 CO and O2 atmosphere gas flooding cluster secondary ions matrix effect;
Podatki
| Jezik: | Angleški jezik |
|---|---|
| Leto izida: | 2022 |
| Tipologija: | 1.01 - Izvirni znanstveni članek |
| Organizacija: | IJS - Institut Jožef Stefan |
| Založnik: | ACS Publications |
| UDK: | 53 |
| COBISS: |
90990339
|
| ISSN: | 1879-1123 |
| Št. ogledov: | 6 |
| Št. prenosov: | 0 |
| Ocena: | 0 (0 glasov) |
| Metapodatki: |
|
Ostali podatki
| Komentar vira: | Nasl. z nasl. zaslona; Opis vira z dne 27. 12. 2021; |
|---|---|
| Strani: | str. 31-44 |
| Letnik: | ǂVol. ǂ33 |
| Zvezek: | ǂiss. ǂ1 |
| Čas izdaje: | 2022 |
| DOI: | 10.1021/jasms.1c00218 |
| ID: | 20349896 |
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