AFM study of roughness development during ToF-SIMS depth profiling of multilayers with a Cs[sup]+ ion beam in a H[sub]2 atmosphere
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Podatki
| Jezik: | Angleški jezik |
|---|---|
| Leto izida: | 2022 |
| Tipologija: | 1.01 - Izvirni znanstveni članek |
| Organizacija: | IJS - Institut Jožef Stefan |
| Založnik: | ACS Publications |
| UDK: | 53 |
| COBISS: |
128549635
|
| ISSN: | 0743-7463 |
| Št. ogledov: | 4 |
| Št. prenosov: | 1 |
| Ocena: | 0 (0 glasov) |
| Metapodatki: |
|
Ostali podatki
| Strani: | str. 12871–12880 |
|---|---|
| Letnik: | ǂVol. ǂ38 |
| Zvezek: | ǂno. ǂ 42 |
| Čas izdaje: | 2022 |
| DOI: | 10.1021/acs.langmuir.2c01837 |
| ID: | 20349898 |
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