Abstract

High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development

Keywords

free-electron lasers;metrology;polymers;X-ray optics;

Data

Language: English
Year of publishing:
Typology: 1.01 - Original Scientific Article
Organization: UNG - University of Nova Gorica
UDC: 53
COBISS: 5537531 Link will open in a new window
ISSN: 1094-4087
Views: 2323
Downloads: 0
Average score: 0 (0 votes)
Metadata: JSON JSON-RDF JSON-LD TURTLE N-TRIPLES XML RDFA MICRODATA DC-XML DC-RDF RDF

Other data

URN: URN:SI:UNG
Type (COBISS): Not categorized
Pages: str. 30686-30695
Volume: ǂVol. ǂ25
Issue: ǂno. ǂ24
Chronology: Nov. 2017
DOI: 10.1364/OE.25.030686
ID: 11369898