Miha Kikelj (Author), Benjamin Lipovšek (Author), Matevž Bokalič (Author), Florian Buchholz (Author), Marko Topič (Author)

Abstract

Interpreting results of spatially resolved characterization methods can prove quite a challenge and it may often happen that a phenomenon takes credit for something it is not responsible for. This is especially important when imaging laterally inhomogeneous devices. We present a derivation, application and validation of a combined opto-electrical model, which sheds light on the roles electrical and optical effects play when it comes to interpretation of EL measurements. We show not only that the device optics and imaging optics cannot be neglected but that they in fact play a major role in shaping the EL measurements.

Keywords

elektroluminiscenca;modeliranje;optika;electroluminescence;modelling;optics;

Data

Language: English
Year of publishing:
Typology: 1.08 - Published Scientific Conference Contribution
Organization: UL FE - Faculty of Electrical Engineering
UDC: 621.383.51
COBISS: 86957059 Link will open in a new window
ISSN: 2196-100X
Views: 155
Downloads: 21
Average score: 0 (0 votes)
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Other data

Secondary language: Slovenian
Secondary keywords: elektroluminiscenca;modeliranje;optika;
Pages: Str. 229-232
DOI: 10.4229/EUPVSEC20212021-2CV.1.4
ID: 14119236