Miha Kikelj (Avtor), Benjamin Lipovšek (Avtor), Matevž Bokalič (Avtor), Florian Buchholz (Avtor), Marko Topič (Avtor)

Povzetek

Interpreting results of spatially resolved characterization methods can prove quite a challenge and it may often happen that a phenomenon takes credit for something it is not responsible for. This is especially important when imaging laterally inhomogeneous devices. We present a derivation, application and validation of a combined opto-electrical model, which sheds light on the roles electrical and optical effects play when it comes to interpretation of EL measurements. We show not only that the device optics and imaging optics cannot be neglected but that they in fact play a major role in shaping the EL measurements.

Ključne besede

elektroluminiscenca;modeliranje;optika;electroluminescence;modelling;optics;

Podatki

Jezik: Angleški jezik
Leto izida:
Tipologija: 1.08 - Objavljeni znanstveni prispevek na konferenci
Organizacija: UL FE - Fakulteta za elektrotehniko
UDK: 621.383.51
COBISS: 86957059 Povezava se bo odprla v novem oknu
ISSN: 2196-100X
Št. ogledov: 155
Št. prenosov: 21
Ocena: 0 (0 glasov)
Metapodatki: JSON JSON-RDF JSON-LD TURTLE N-TRIPLES XML RDFA MICRODATA DC-XML DC-RDF RDF

Ostali podatki

Sekundarni jezik: Slovenski jezik
Sekundarne ključne besede: elektroluminiscenca;modeliranje;optika;
Strani: Str. 229-232
DOI: 10.4229/EUPVSEC20212021-2CV.1.4
ID: 14119236