from characterization to advanced electrical modelling
Miha Kikelj (Author), Benjamin Lipovšek (Author), Matevž Bokalič (Author), Marko Topič (Author)

Abstract

In this contribution we present a fully scalable, quasi-SPICE distributed modelling approach for a wholesome analysis of stress induced, as well as inherent inhomogeneities (material impurities, grain boundaries) in silicon solar cells and PV modules based on electroluminescence imaging. We describe the derivation of electrical models for different IEC TS 60904-13 recognised stress induced inhomogeneities, namely the active and the inactive cracks, dead cell areas, and contact finger interruptions, and highlight their effects on the current-voltage characteristic of the cell. We validate our model on a selection of experimental cases of sample silicon solar cells on the basis of a comparative study of current-voltage characteristics and electroluminescence images. We demonstrate the applicability of our model on a complexly damaged full-sized sample cell, showing excellent agreement with the measurements.

Keywords

elektroluminiscenca;mikrorazpoke;modeliranje;nehomogenosti;electroluminescence;microcracks;modelling;inhomogeneities;

Data

Language: English
Year of publishing:
Typology: 1.08 - Published Scientific Conference Contribution
Organization: UL FE - Faculty of Electrical Engineering
UDC: 621.383.51
COBISS: 36809731 Link will open in a new window
ISSN: 2196-100X
Views: 136
Downloads: 17
Average score: 0 (0 votes)
Metadata: JSON JSON-RDF JSON-LD TURTLE N-TRIPLES XML RDFA MICRODATA DC-XML DC-RDF RDF

Other data

Secondary language: Slovenian
Secondary keywords: elektroluminiscenca;mikrorazpoke;modeliranje;nehomogenosti;
Pages: Str. 286-289
DOI: 10.4229/EUPVSEC20202020-2CO.15.6
ID: 14119262