S. Soumya (Author), Vimal Raj (Author), Mohanachandran Nair Sindhu Swapna (Author), Sankaranarayana Iyer Sankararaman (Author)

Abstract

The multifractal analysis is a potential method for assessing thin flm surface morphology and its changes due to diferent deposition conditions and post-deposition treatments. In this work, the multifractal analysis is carried out to understand the surface morphology—root mean square (RMS) surface roughness—of nanostructured MoO3 flms prepared by pulsed laser deposition technique by varying the ablation time and post-deposition annealing. The XRD analysis shows the evolution of crystalline nature with annealing temperature. The XRD pattern of all the annealed flms shows the characteristic peak of the orthorhombic MoO3 phase. The FESEM and AFM analysis reveals the morphological modifcation with ablation time and annealing temperature. The multifractal analysis of the AFM images shows that the box—counting, information and correlation dimension varies with the annealing temperature. The study also reveals the inverse relation between the fractal dimension and the RMS surface roughness due to the annealing induced particle size variation and reorientation. The fractal dimension’s evolution in the pulsed laser deposited MoO3 flm with ablation time and annealing temperature is also investigated. Thus, the study reveals the potential of multifractal analysis in the thin flm surface characterizatio

Keywords

multifractal analysis;pulsed laser deposition;molybdenum oxide;atomic force microscopy;fractal dimension;

Data

Language: English
Year of publishing:
Typology: 1.02 - Review Article
Organization: UNG - University of Nova Gorica
UDC: 54
COBISS: 113745411 Link will open in a new window
ISSN: 1432-0630
Views: 488
Downloads: 0
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Other data

URN: URN:SI:UNG
Type (COBISS): Not categorized
Pages: str. 1-10
Volume: ǂVol. ǂ127
Issue: ǂiss. ǂ7
Chronology: 2021
DOI: 10.1007/s00339-021-04676-6
ID: 15822792