Tonica Bončina (Author)

Abstract

Elektronska vrstična mikroskopija pri povišanem tlaku (ESEM)

Keywords

okoljski vrstični elektronski mikroskop;sekundarni okoljski elektroni;plinski detektor za sekundarne ione;reducirna zaslonka;

Data

Language: Slovenian
Year of publishing:
Typology: 1.04 - Professional Article
Organization: UM FS - Faculty of Mechanical Engineering
Publisher: Društvo za vakuumsko tehniko Slovenije
UDC: 620.187.2
COBISS: 15158294 Link will open in a new window
ISSN: 0351-9716
Parent publication: Vakuumist
Views: 511
Downloads: 37
Average score: 0 (0 votes)
Metadata: JSON JSON-RDF JSON-LD TURTLE N-TRIPLES XML RDFA MICRODATA DC-XML DC-RDF RDF

Other data

Secondary language: English
Secondary title: The environmental scanning electron microscopy (ESEM)
Secondary keywords: environmental scanning electron microscopy;secondary environmental electrons;gaseous detector for secondary electrons;pressure-limiting-aperture;
URN: URN:NBN:SI:doc-VZZABVAI
Type (COBISS): Not categorized
Pages: str. 14-19
Volume: Letn. 31
Issue: št. 2
Chronology: jun. 2011
ID: 1727878