Hanna Budasheva (Author), Mohanachandran Nair Sindhu Swapna (Author), Sankaranarayana Iyer Sankararaman (Author), Dorota Korte Kobylinska (Author)

Abstract

Sample characterization by transverse photothermal beam deflection spectrometry in skimming configuration

Keywords

photothermal techniques;beam deflection spectrometry;material characterization;

Data

Language: English
Year of publishing:
Typology: 1.02 - Review Article
Organization: UNG - University of Nova Gorica
UDC: 54
COBISS: 155461891 Link will open in a new window
ISSN: 0021-8979
Views: 579
Downloads: 0
Average score: 0 (0 votes)
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Other data

Type (COBISS): Not categorized
Pages: str. 1-24
Volume: ǂVol. ǂ133
Issue: ǂissue ǂ21, [article no.] 211101
Chronology: Jun. 2023
DOI: 10.1063/5.0148079
ID: 21815621