Primož Rebernik Ribič (Avtor),
Alessandro Abrami (Avtor),
Laura Badano (Avtor),
Maurizio Bossi (Avtor),
Hans-Heinrich Braun (Avtor),
Niky Bruchon (Avtor),
Flavio Capotondi (Avtor),
Davide Castronovo (Avtor),
Marco Cautero (Avtor),
Paolo Cinquegrana (Avtor),
Giovanni De Ninno (Avtor)
Povzetek
X-ray free-electron lasers (FELs), which amplify light emitted by a relativistic electron beam, are extending nonlinear optical techniques to shorter wavelengths, adding element specificity by exciting and probing electronic transitions from core levels. These techniques would benefit tremendously from having a stable FEL source, generating spectrally pure and wavelength-tunable pulses. We show that such requirements can be met by operating the FEL in the so-called echo-enabled harmonic generation (EEHG) configuration. Here, two external conventional lasers are used to precisely tailor the longitudinal phase space of the electron beam before emission of X-rays. We demonstrate high-gain EEHG lasing producing stable, intense, nearly fully coherent pulses at wavelengths as short as 5.9 nm (~211 eV) at the FERMI FEL user facility. Low sensitivity to electron-beam imperfections and observation of stable, narrow-band, coherent emission down to 2.6 nm (~474 eV) make the technique a prime candidate for generating laser-like pulses in the X-ray spectral region, opening the door to multidimensional coherent spectroscopies at short wavelengths.
Ključne besede
laserji na proste elektrone;koherenca;rentgenski žarki;free electron laser;coherence;x-rays;
Podatki
| Jezik: |
Angleški jezik |
| Leto izida: |
2019 |
| Tipologija: |
1.01 - Izvirni znanstveni članek |
| Organizacija: |
UNG - Univerza v Novi Gorici |
| UDK: |
53 |
| COBISS: |
5380859
|
| ISSN: |
1749-4885 |
| Št. ogledov: |
2622 |
| Št. prenosov: |
0 |
| Ocena: |
0 (0 glasov) |
| Metapodatki: |
|
Ostali podatki
| URN: |
URN:SI:UNG |
| Vrsta dela (COBISS): |
Delo ni kategorizirano |
| Strani: |
str. 555-561 |
| Letnik: |
ǂVol. ǂ13 |
| Zvezek: |
ǂiss. ǂ8 |
| Čas izdaje: |
2019 |
| DOI: |
10.1038/s41566-019-0427-1 |
| ID: |
11132571 |