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Št. zadetkov: 3
Detailed 3D optical modelling of interdigitated back contact solar cells
Miha Kikelj, Benjamin Lipovšek, Matevž Bokalič, Florian Buchholz, Marko Topič
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Oznake: modeliranje;optika;sončne celice s kontakti na zadnji strani;modelling;optics;interdigitated back contact solar cells;
A development and calibration of a detailed 3D coupled ray-wave optical model for accurate simulations of laterally varying photovoltaic structures is presented and applied for the analysis of interdigitated back contact cells. Four key aspects, which predominantly contribute to the accuracy of opti ...
Leto: 2021 Vir: Fakulteta za elektrotehniko (UL FE)
“Do not blame the butter for what the bread did” or how the optical properties of IBC solar cells affect the results of spatially resolved characterization methods
Miha Kikelj, Benjamin Lipovšek, Matevž Bokalič, Florian Buchholz, Marko Topič
Objavljeni znanstveni prispevek na konferenci
Oznake: elektroluminiscenca;modeliranje;optika;electroluminescence;modelling;optics;
Interpreting results of spatially resolved characterization methods can prove quite a challenge and it may often happen that a phenomenon takes credit for something it is not responsible for. This is especially important when imaging laterally inhomogeneous devices. We present a derivation, applicat ...
Leto: 2021 Vir: Fakulteta za elektrotehniko (UL FE)
EL and LBIC characterization of cut edge recombination in IBC solar cells
Matevž Bokalič, Miha Kikelj, Kristijan Brecl, Marko Jankovec, Florian Buchholz, Valentin Mihailetchi, Marko Topič
Objavljeni znanstveni prispevek na konferenci
Oznake: elektroluminiscenca;LBIC;rekombinacija na robu;IBC;prepleteni zadnji kontakti;multikristalni silicij;sončne celice;electroluminescence;edge recombination;silicon solar cells;
The interconnection of cut cells is a way to improve cell to module efficiency ratio. While this approach minimizes series resistance losses and improves module area utilization, it introduces recombination losses due to imperfect cuts. We propose two additional methods to characterize edge recombin ...
Leto: 2020 Vir: Fakulteta za elektrotehniko (UL FE)
Št. zadetkov: 3
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