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Fractal and inertia moment analyses for thin-film quality monitoring
Sivan Pillai Soumya, Vimal Raj, Mohanachandran Nair Sindhu Swapna, S. Sreejyothi, Sankarapanicker Suresh, Sankaranarayana Iyer Sankararaman
Izvirni znanstveni članek
Oznake: cross-correlation;fractal dimension;inertia moment;
The widespread applications of thin films in optronics demand innovative techniques for its characterizations. The work reported here proposes electronic speckle pattern interferometry and fractal-based methods for assessing the quality of thin films taking the industrially relevant molybdenum oxide ...
Leto: 2022 Vir: Repozitorij Univerze v Novi Gorici (RUNG)
Št. zadetkov: 1
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