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Št. zadetkov: 6
Photocatalysis for disinfection and removal of contaminants of emerging concern
Suresh C. Pillai, Urška Lavrenčič Štangar, John A. Byrne, Alejandro Pérez-Larios, Dionysia Dionysiou
Predgovor, spremna beseda
Oznake: fotokataliza;konference;
Photocatalysis for disinfection and removal of contaminants of emerging concern
Leto: 2015 Vir: Repozitorij Univerze v Novi Gorici (RUNG)
ǂThe ǂmotives and benefits of using customer experience led differentiators in the re-launching of a failed product
Anil Pillai, Babu P. George
Izvirni znanstveni članek
Oznake: customer experience;product re-launch;business to business;qualitative research;marketing;India;
#The #motives and benefits of using customer experience led differentiators in the re-launching of a failed product
Leto: 2015 Vir: Gea College - Fakulteta za podjetništvo (GEA College - FP)
Determination of nitrite and nitrogen dioxide by spectrophotometry after solidphase extraction
Prachi Parmar, Sunitha B Mathew, Vinay Gupta, Ajai Kumar Pillai
Izvirni znanstveni članek
Oznake: diazotiranje;spektroskopija;dušikov dioksid;feron;nitriti;stehiometrija;absorpcija;
Leto: 2008 Vir: dLib.si Digitalna knjižnica Slovenije
Re-entrant spin glass behaviour and magneto-dielectric effect in insulating Sm [sub] 2NiMnO [sub] 6 double perovskite
P. Neenu Lekshmi, G. R. Raji, M. Vasundhara, Manoj Raama Varma, S. Savitha Pillai, Matjaž Valant
Izvirni znanstveni članek
Oznake: spinska stekla;magneto-elektriki;peroksidi;
Leto: 2013 Vir: Repozitorij Univerze v Novi Gorici (RUNG)
Fractal analysis as a potential tool for surface morphology of thin films
S. Soumya, Mohanachandran Nair Sindhu Swapna, Vimal Raj, V. P. Mahadevan Pillai, Sankaranarayana Iyer Sankararaman
Izvirni znanstveni članek
Oznake: fractals;thin films;AFM;surface morphology;
Fractal analysis as a potential tool for surface morphology of thin films
Leto: 2017 Vir: Repozitorij Univerze v Novi Gorici (RUNG)
Fractal and inertia moment analyses for thin-film quality monitoring
Sivan Pillai Soumya, Vimal Raj, Mohanachandran Nair Sindhu Swapna, S. Sreejyothi, Sankarapanicker Suresh, Sankaranarayana Iyer Sankararaman
Izvirni znanstveni članek
Oznake: cross-correlation;fractal dimension;inertia moment;
The widespread applications of thin films in optronics demand innovative techniques for its characterizations. The work reported here proposes electronic speckle pattern interferometry and fractal-based methods for assessing the quality of thin films taking the industrially relevant molybdenum oxide ...
Leto: 2022 Vir: Repozitorij Univerze v Novi Gorici (RUNG)
Št. zadetkov: 6
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