S. Soumya (Author), Mohanachandran Nair Sindhu Swapna (Author), Vimal Raj (Author), V. P. Mahadevan Pillai (Author), Sankaranarayana Iyer Sankararaman (Author)

Abstract

Fractal analysis as a potential tool for surface morphology of thin films

Keywords

fractals;thin films;AFM;surface morphology;

Data

Language: English
Year of publishing:
Typology: 1.01 - Original Scientific Article
Organization: UNG - University of Nova Gorica
UDC: 54
COBISS: 113880067 Link will open in a new window
ISSN: 2190-5444
Views: 473
Downloads: 0
Average score: 0 (0 votes)
Metadata: JSON JSON-RDF JSON-LD TURTLE N-TRIPLES XML RDFA MICRODATA DC-XML DC-RDF RDF

Other data

URN: URN:SI:UNG
Type (COBISS): Not categorized
Pages: str. 1-7
Volume: ǂVol. ǂ132
Issue: ǂiss. ǂ12
Chronology: 2017
DOI: 10.1140/epjp/i2017-11826-8
ID: 15832551