S. Soumya (Author), Mohanachandran Nair Sindhu Swapna (Author), Sankaranarayana Iyer Sankararaman (Author)

Abstract

Nondestructive Evaluation of Surface Roughness of Thin Films through Fractal Analysis, S Soumya

Keywords

nondestructive evaluation;surface roughness;thin films;fractal analysis;

Data

Language: English
Year of publishing:
Typology: 1.01 - Original Scientific Article
Organization: UNG - University of Nova Gorica
UDC: 54
COBISS: 113934083 Link will open in a new window
ISSN: 0973-631X
Views: 466
Downloads: 0
Average score: 0 (0 votes)
Metadata: JSON JSON-RDF JSON-LD TURTLE N-TRIPLES XML RDFA MICRODATA DC-XML DC-RDF RDF

Other data

URN: URN:SI:UNG
Type (COBISS): Not categorized
Pages: str. 255-259
Volume: ǂVol. ǂ11
Issue: ǂno. ǂ3
Chronology: 2017
ID: 15832566