Franc Zupanič (Author)

Abstract

Uporaba mikroposnetkov z odbitimi elektroni pri identifikaciji faz

Keywords

odbiti elektroni;koeficient povratnega sipanja elektronov;vrstična elektronska mikroskopija;SEM;karakterizacija;

Data

Language: Slovenian
Year of publishing:
Typology: 1.01 - Original Scientific Article
Organization: UM FS - Faculty of Mechanical Engineering
Publisher: Društvo za vakuumsko tehniko Slovenije
UDC: 620.187.2
COBISS: 14841622 Link will open in a new window
ISSN: 0351-9716
Parent publication: Vakuumist
Views: 359
Downloads: 29
Average score: 0 (0 votes)
Metadata: JSON JSON-RDF JSON-LD TURTLE N-TRIPLES XML RDFA MICRODATA DC-XML DC-RDF RDF

Other data

Secondary language: English
Secondary title: Application of backstattered-electron micrographs for phase identification
Secondary keywords: backscattered electrons;backscattering coefficient;scanning electron microscopy;SEM;characterization;
URN: URN:NBN:SI:doc-IO9DQFI7
Type (COBISS): Not categorized
Pages: str. 4-7
Volume: Letn. 31
Issue: št. 1
Chronology: mar. 2011
ID: 1728656