Language: | Slovenian |
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Year of publishing: | 2011 |
Typology: | 1.01 - Original Scientific Article |
Organization: | UM FS - Faculty of Mechanical Engineering |
Publisher: | Društvo za vakuumsko tehniko Slovenije |
UDC: | 620.187.2 |
COBISS: | 14841622 |
ISSN: | 0351-9716 |
Parent publication: | Vakuumist |
Views: | 359 |
Downloads: | 29 |
Average score: | 0 (0 votes) |
Metadata: |
Secondary language: | English |
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Secondary title: | Application of backstattered-electron micrographs for phase identification |
Secondary keywords: | backscattered electrons;backscattering coefficient;scanning electron microscopy;SEM;characterization; |
URN: | URN:NBN:SI:doc-IO9DQFI7 |
Type (COBISS): | Not categorized |
Pages: | str. 4-7 |
Volume: | Letn. 31 |
Issue: | št. 1 |
Chronology: | mar. 2011 |
ID: | 1728656 |